Method for inspecting semiconductor device

Details Method for inspecting semiconductor device Method for inspecting semiconductor device

2008-06-06

2010-11-09

Lebentritt, Michael S (Department: 2829)

Semiconductor device manufacturing: process

With measuring or testing

Packaging or treatment of packaged semiconductor

C438S017000, C438S019000, C257SE21007, C257SE21207, C257SE21585, C257SE21599

Reexamination Certificate

active

07829355

ABSTRACT:
A method for inspecting a semiconductor device includes carrying out a first test for inspecting characteristics of semiconductor devices under a shielded (dark) condition to discriminate non-defective devices; and carrying out a second test on the semiconductor devices which have passed the first test as non-defective devices, for inspecting characteristics of the semiconductor devices. The second test is carried out while a predetermined color of light is applied to the semiconductor devices.

REFERENCES:
patent: 4556317 (1985-12-01), Sandland et al.
patent: 4881863 (1989-11-01), Braginsky
patent: 2002/0076654 (2002-06-01), Hasegawa et al.
patent: 02103947 (1990-04-01), None
patent: 05054694 (1993-03-01), None
patent: 08122209 (1996-05-01), None
patent: 2000-121494 (2000-04-01), None
patent: 2005216904 (2005-08-01), None
patent: 2006310817 (2006-11-01), None

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