Method for inspecting electrical devices

Radiant energy – Radiation tracer methods

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250461, 324 54, 324158R, 357 52, G09K 300

Patent

active

042373794

ABSTRACT:
A method of inspecting electrical devices such as integrated circuit devices which have conductors covered by a protective layer of passivating material to determine the quality of the protective layer includes treating the circuit with a fluorescein containing dye and exposing the treated device to UV radiation while applying a voltage between two conductors. Fluorescence is observable in well passivated areas of the device but not in unpassivated or inadequately passivated areas. When a device is tested before dicing from a wafer, adjacent devices to which no voltage is applied fluoresce in both passivated and unpassivated areas.

REFERENCES:
patent: 2472522 (1949-06-01), deForest
patent: 3465150 (1969-09-01), Hugle
patent: 3490873 (1970-01-01), Corl
patent: 3567932 (1971-03-01), Alburger
patent: 3750018 (1973-07-01), Leone et al.
"Dye Lasers" by F. P. Schafer, pp. 164-166, published in Topics in Applied Physics, vol. #1.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for inspecting electrical devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for inspecting electrical devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for inspecting electrical devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2285715

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.