Measuring and testing – Vibration – By mechanical waves
Patent
1993-09-02
1995-09-12
Williams, Hezron E.
Measuring and testing
Vibration
By mechanical waves
73615, G01N 2900
Patent
active
054489156
ABSTRACT:
The invention provides a method for measuring thickness of sample of material having a surface finish in a time of flight system using an ultrasonic thickness gauge, comprising the steps of: defining the time of flight system as a function of t'=h'.div.Va' +C(f) where t' is the time of flight of an ultrasonic wave though the calibration sample, h' is a mechanically measured thickness of the calibration material, Va' is one half the velocity of sound through the material, and C(f) is a surface finish dependent time offset calibrated for the finish of the near and far side surfaces; passing an actual wave with the velocity of 2Va through the sample; measuring the time of flight (t) of the actual ultrasonic wave though the sample; providing the surface finish dependent time offset calibrated for the finish of each surface of the material; and establishing a corrected thickness measurement (CTM) as a function of the surface finish dependent offset (C(f)) which satisfies the condition CTM=Va.times.(t-C(f)).
REFERENCES:
patent: 4182155 (1980-01-01), Fowler
patent: 4437332 (1984-03-01), Pittaro
patent: 4800757 (1989-01-01), Hashinoki et al.
patent: 5038615 (1991-08-01), Trulson et al.
patent: 5062298 (1991-11-01), Falcoff et al.
patent: 5201225 (1993-04-01), Takahashi et al.
Dunn Dan
Waldenmaier Eugene
Denson-Low W. K.
Hughes Aircraft Company
Kwok Helen C.
Schubert W. C.
Williams Hezron E.
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