Television – Camera – system and detail – Solid-state image sensor
Reexamination Certificate
2005-11-08
2005-11-08
Ometz, David L. (Department: 2615)
Television
Camera, system and detail
Solid-state image sensor
C348S308000
Reexamination Certificate
active
06963370
ABSTRACT:
A method for improving SNR without reducing dynamic range in a CMOS video sensor system under low illumination is described, wherein the CMOS video sensor system employing self-reset DPS architecture includes pixel level A/D conversion and wherein each DPS pixels is capable of resetting itself whenever a corresponding diode reaches saturation during integration time, the method comprising the steps of eliminating global frame reset for the self-reset DPS pixels, capturing and storing a plurality of frames, extending integration time beyond frame readout time, and generating frame images using one or more previously stored frames.
REFERENCES:
patent: 4819075 (1989-04-01), Imaide et al.
patent: 5153421 (1992-10-01), Tandon et al.
patent: 5194957 (1993-03-01), Kyuma
patent: 5272535 (1993-12-01), Elabd
patent: 5461425 (1995-10-01), Fowler et al.
patent: 5786582 (1998-07-01), Roustaei et al.
patent: 5801657 (1998-09-01), Fowler et al.
patent: 5818052 (1998-10-01), Elabd
patent: 5841126 (1998-11-01), Fossum et al.
patent: 5844514 (1998-12-01), Ringh et al.
patent: 5943388 (1999-08-01), Tumer
patent: 5962844 (1999-10-01), Merrill et al.
patent: 6008486 (1999-12-01), Stam et al.
patent: 6115065 (2000-09-01), Yadid-Pecht et al.
patent: 6130713 (2000-10-01), Merrill
patent: 6175383 (2001-01-01), Yadid-Pecht et al.
patent: 6525304 (2003-02-01), Merrill et al.
patent: 6809769 (2004-10-01), Yang
patent: 2003/0058356 (2003-03-01), DiCarlo et al.
patent: 2003/0058360 (2003-03-01), Liu et al.
X. Q. Liu et al; “Simultaneous image formation and motion blur restoration via multiple capture;” In ICASSP' 2001 conference, Salt Lake City, Utah, May 2001 (Presentation).
X. Q. Liu et al.; “Photocurrent estimation from multiple non-destructive samples in a CMOS image sensor;” In Proceedings of the SPIE Electronic Imaging' 2001 conference, vol. 4306, San Jose, CA, Jan. 2001. (Presentation).
D. Yang et al.; “Comparative analysis of SNR for image sensors with enhanced dynamic range;” In Proceedings of the SPIE Electronic Imaging' 99 conference, vol. 3649, San Jose, CA, Jan. 1999 (Presentation).
B. Fowler et al.; “A method for estimating quantum efficiency for CMOS image sensors;” In Proceedings of the SPIE , vol. 3301, pp178-185, Apr. 1998.
D. Yang et al.; “A nyquist rate pixel level ADC for CMOS image sensors;” In IEEE Journal of Solid State Circuits, vol. 34 No. 3, p. 348-356, Mar. 1999.
B. Fowler et al.; “Techniques for pixel-level analog-to-digital conversion;” In Proceeding of SPIE, Infrared Readout Electronics IV, pp 2-12, vol. 3360, Orlando, Apr. 1998. (Presentation).
S. Kleinfelder et al.; “A 10,000 frames/s 0.18 um COMS digital pixel sensor with pixel-level memory;” In Proceeding of the 2001 IEEE International Solid-State Circuits Conference, pp. 88-89, San Francisco, CA, Feb. 2001. (Presentation).
A. El Gamal et al.; “Modeling and estimation of FPN components in CMOS image sensors;” In Proceedings of SPIE, vol. 3301, pp. 168-177, Apr. 1998.
A. El Gamal et al.; “Pixel level processing-why, what and how?;” In Proceedings of the SPIE Electronic Imaging' 99 conference, vol. 3650 , Jan. 1999. (Presentation).
H. Tian et al.; “Analysis of temporal noise in CMOS photodiode active pixel sensor;” In IEEE Journal of Solid State Circuits, vol. 36, No. 1, pp. 92-101, Jan. 2001.
D. Yang et al.; “A 128×128 pixel CMOS area image sensor with multiplexed pixel level A/D conversion;” In IEEE 1996 Custom Integrated Circuits Conference, San Diego, CA, May 1996.
D. Yang et al.; “A 640×512 CMOS image sensor with ultra wide dynamic range floating-point pixel-level ADC;” In IEEE Journal of Solid State Circuits, vol. 34, No. 12, p. 1821-1834, Dec. 1999.
Woodward Yang et al.; “An integrated 800×600 CMOS Imaging system;” ISSCC99/Session 17/Paper WA 17.3; 1999 IEEE International Solid-State Circuits Conference.
Hon-Sum Philip Wong et al.; “CMOS active pixel image sensors fabricated using a 1.8-V, 0.25-um CMOS technology;” IEEE Transactions on Electron Devices, vol. 45, No. 4, Apr. 1998.
Hon-Sum Wong; “Technology and device scaling considerations for CMOS imagers;” IEEE Transactions on Electron Devices, vol. 43, No. 12, Dec. 1996.
Peter Centen; “CCD on-chip amplifiers: noise performance versus MOS transistor dimensions;” IEEE Transaction on Electron Devices, vol. 38 No. 5 May 1991.
Steven Decker et al.; “A 256×256 CMOS imaging array with wide dynamic range pixels and column-parallel digital output;” IEEE Journal of Solid-State Circuits, vol. 33, No. 12, Dec. 1998.
DiCarlo Jeffrey M.
El Gamal Abbas
Liu Xinqiao
Wandell Brian
Jelinek Brian
Lumen Intellectual Property Services Inc.
Ometz David L.
LandOfFree
Method for improving SNR in low illumination conditions in a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for improving SNR in low illumination conditions in a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for improving SNR in low illumination conditions in a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3511211