Data processing: measuring – calibrating – or testing – Calibration or correction system
Patent
1997-10-23
2000-05-09
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Calibration or correction system
702 69, 702191, 356318, 356316, G01J 300
Patent
active
060616415
ABSTRACT:
This invention pertains generally to a method for improving the accuracy of particle analysis under conditions of discrete particle loading and particularly to a method for improving signal-to-noise ratio and instrument response in laser spark spectroscopic analysis of particulate emissions. Under conditions of low particle density loading (particles/m.sup.3) resulting from low overall metal concentrations and/or large particle size uniform sampling can not be guaranteed. The present invention discloses a technique for separating laser sparks that arise from sample particles from those that do not; that is, a process for systematically "gating" the instrument response arising from "sampled" particles from those responses which do not, is dislosed as a solution to his problem. The disclosed approach is based on random sampling combined with a conditional analysis of each pulse. A threshold value is determined for the ratio of the intensity of a spectral line for a given element to a baseline region. If the threshold value is exceeded, the pulse is classified as a "hit" and that data is collected and an average spectrum is generated from an arithmetic average of "hits". The true metal concentration is determined from the averaged spectrum.
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Flower William L.
Hahn David W.
Hencken Kenneth R.
Johnsen Howard A.
Bui Bryan
Evans Timothy
Hoff Marc S.
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