Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning
Reexamination Certificate
2006-10-17
2006-10-17
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Circuit tuning
Reexamination Certificate
active
07124049
ABSTRACT:
In one embodiment, a method comprises storing parameters that are related to switch error correction terms of a vector network analyzer (VNA), and applying a calibration process of a TRL group of calibration processes to the VNA to generate calibration measurements, wherein the calibration process generates calibration measurements, calculates a switch error correction matrix using the stored parameters and a subset of the calibration measurements, and applies the switch error correction matrix to calibration measurements before solving for eight-systematic error terms associated with the calibration process.
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GB Search Report dated Mar. 28, 2006.
European Search Report issued for GB0524680.6, dated Mar. 28, 2006, 1 page.
Anderson Keith F.
Blackham David V.
Liu James C.
Wong Kenneth H.
Agilent Technologie,s Inc.
Lau Tung S
Nghiem Michael
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