Method for imaging liquid and dielectric materials with scanning

Details Method for imaging liquid and dielectric materials with scanning Method for imaging liquid and dielectric materials with scanning

1997-06-09

1999-03-09

Noland, Thomas P.

Measuring and testing

Surface and cutting edge testing

Roughness

250307, G01B 734

Patent

active

058803602

ABSTRACT:
The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

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