Method for identifying untestable and redundant faults in sequen

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G01R 3128

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055598110

ABSTRACT:
A method of identifying redundant and untestable faults in a sequential logic circuit. A lead in the circuit is selected and the circuit is analyzed to determine which faults would be hypothetically undetectable at a given time frame if the selected circuit lead were unable to assume a logic 0 at a starting time frame, and which faults would be hypothetically undetectable at the given time frame if the selected circuit lead were unable to assume a logic 1 at the starting time frame. Faults that would be undetectable at the given time frame in both hypothetical cases are identified as redundant and untestable faults. This analysis may be repeated for each of a plurality of time frames in a range of time frames which includes the starting time frame. Faults whose detection would not be possible if the selected lead were unable to assume a given value at the starting time frame may be determined based on a sequential implication procedure comprising the propagation of uncontrollability indicators and the backward propagation of unobservability indicators. An uncontrollability indicator for the given (0 or 1) value is assigned to the selected circuit lead and is propagated through the circuit and/or through a range of time frames according to a predetermined set of propagation rules. Unobservability indicators are generated in the circuit at various time frames based on the uncontrollability indicators, and these unobservability indicators are then propagated backward through the circuit and/or backward through the range of time frames, also in accordance with a predetermined set of propagation rules. The hypothetically undetectable faults are then determined based on the resultant indicators and their corresponding circuit leads and associated time frames.

REFERENCES:
patent: 4716564 (1987-12-01), Hung et al.
patent: 4862399 (1989-08-01), Freeman
patent: 5257268 (1993-10-01), Agrawal et al.
patent: 5291495 (1994-03-01), Udell, Jr.
patent: 5331570 (1994-07-01), Bershteyn
patent: 5377197 (1994-12-01), Patel et al.
patent: 5410552 (1995-04-01), Hosokawa
M. H. Schulz and E. Auth, "Essential: An Efficient Self-Learning Test Pattern Generation Algorithm For Sequential Circuits," IEEE 1989 International Test Conference, pp. 2.3, pp. 28-37.
R. Razdan et al., "An Interactive Sequential Test Pattern Generation System," IEEE 1989 International Test Conference, Paper 2.4, pp. 38-46.
Friedman, A. D., "Fault Detection in Redundant Circuits," IEEE Trans. on Electronic Computers, vol. EC-16, pp. 99-100, Feb., 1967.
Abramovici, M. and M. A. Iyer, "One-Pass Redundancy Identification and Removal," Proc. Intn'l Test Conf., pp. 807-815, Sep. 1992.
Harihara, M. and P. R. Menon, "Identification of Undetectable Faults in Combinational Circuits," Proc. Intn'l Conf. on Computer Design, pp. 290-293, Oct. 1989.
Menon, P. R. and H. Ahuja, "Redundancy Removal and Simplification of Combinational Circuits," Digest of Papers, IEEE VLSI Test Symposium, pp. 268-273, Apr. 1992.
Giraldi, J. and M. L. Bushnell, "Search State Equivalence for Redundancy Identification and Test Generation," Proc. Intn'l Test Conf., pp. 184-193, Oct. 1991.
Abramovici, M., J. J. Kulikowski and R. K. Roy, "The Best Flip-Flops to Scan," Proc. Intn'l Test Conference, pp. 166-173, Oct. 1991.
Brglez, F., D. Bryan, and K. Kozminski, "Combinational Profiles of Sequential Benchmark Circuits," Proc. 1989 Intn'l Symposium on Circuits and Systems, pp. 1929-1934, May 1989.
Abramovici, M., J. J. Kulikowski, P. R. Menon, and D. T. Miller, "Smart and Fast: Test Generation for VLSI Scan-Design Circuits," IEEE Design and Test of Computers, pp. 43-54, Aug. 1986.
Abramovici, M., D. T. Miller, and R. K. Roy, "Dynamic Redundancy Identification in Automatic Test Generation," IEEE Trans. on CAD, pp. 404-407, Mar. 1992.
Chakradhar, S. T., V. D. Agrawal, and S. G. Rothweiler, "A Transitive Closure Algorithm for Test Generation," IEEE Trans. on CAD, vol. 12, No. 7 pp. 1015-1028, Jul. 1993.
Kunz, W. and D. K. Pradhan, "Recursive Learning: An Attractive Alternative to the Decision Tree for Test Generation in Digital Circuits," Proc. Intn'l Test Conf., pp. 816-825, Sep. 1992.
Agrawal, V. D. and S. T. Chakradhar, "Combinational ATPG Theorems for Identifying Untestable Faults in Sequential Circuits," Proc. European Test Conf., pp. 249-253, April 1993.
Abramovici, M. and M. A. Breuer, "On Redundancy and Fault Detection in Sequential Circuits," IEEE Trans. on Computers, vol. C-28, pp. 864-865, Nov. 1979.
Davidson, S., "Is I.sub.DDQ Yield Loss Inevitable:" Proc. Intn'l Test Conf., Oct. 1994, pp. 572-579.
Cheng, K. T., "On Removing Redundancy in Sequential Circuits," Proc. 28th Design Automation Conf., pp. 164-169, Jun., 1991.
Cheng, K. T., "An ATPG-Based Approach to Sequental Logic Optimization," Proc. Intn'l Conf. on Computer Aided Design, pp. 372-375, 1991.
Cho, H., G. D. Hachtel and F. Somenzi, "Redundancy Identification/Removal and Test Generation for Sequential Circuits Using Implicit State Enumeration," IEEE Trans. on CAD, vol. 12, No. 7, 935-945, Jul. 1993.
Moondanos, J. and J. A. Abraham, "Sequential Redundancy Identification Using Verification Techniques," Proc. Intn'l Test Conf., pp. 197-205, Sep. 1992.
Iyer, M. A. and M. Abramovici, "Low-Cost Redundancy Identification for Combinational Circuits," Proc. 7th Intn'l Conf. VLSI Design, India, pp. 315-318, Jan. 1994.
Pomeranz, I. and S. M. Reddy, "The Multiple Observation Time Test Strategy," IEEE Trans. on Computers, vol. 41, No. 5, pp. 627-637, May 1992.
Pomeranz, I. and S. M. Reddy, "Classification of Faults in Synchronous Sequential Circuits," IEEE Trans. on Computers, vol. 42, No. 9, Sep. 1993, pp. 1066-1077.
Pomeranz, I. and S. M. Reddy, "On Identifying Undetectable and Redundant Fault in Synchronous Sequential Circuits," 12th IEEE VLSI Test Symposium, pp. 8-14, Apr. 1994.
Ibarra, O. H. and S. K. Sahni, "Polynomially Complete Fault Detection Problems," IEEE Trans. on Computers, vol. C-24, pp. 242-249, Mar. 1975.
Chakraborty, T. J., S. Davidson, and B. Bencivenga, "The Architecture of the GenTest Sequential Circuit Test Generator," Proc. IEEE Custom Integrated Circuits Conference, May 1991, pp. 17.1.1-17.1.4.
Iyer, M. A. and M. Abramovici, "Sequentially Untestable Faults Identified Without Search (Simple Implications Best Exhaustive Search!)," Proc. Intn'l Test Conf., pp. 259-266, Oct. 1994.
Pomeranz, I. and S. M. Reddy, "On Achieving Complete Testability of Synchronous Sequential Circuits with Synchronous Sequential," Proc. Intnl. Test Conf., pp. 1007-1016, Oct., 1994.
Entrena, L. and K. T. Cheng, "Sequential Logic Optimization By Redundancy Addition and Removal," Proc. Intn'l Conf. on CAD, pp. 310-315, Nov. 1993.
Abramovici, M. and M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design,IEEE Press, 1994.
Pomeranz, I., S. M. Reddy and J. H. Patel, "Theory and Practice of Sequential Machine Testing and Testability," Proc. 22nd. Fault Tolerant Computing Symp., pp. 1-8, 1993.
Abramovici, M. and P. S. Parikh, "Warning: 100% Fault Coverage May be Misleading!!" Proc. Intnl. Test Conf., pp. 662-668, Sep. 1992.
Gupta, R. R. Gupta and M. A. Breuer, "The Ballast Methodology for Structured Partial Scan," IEEE Trans. on Computers, pp. 538-544, Apr. 1990.
Leiserson, C. E. and J. B. Saxe, "Retiming Synchronous Circuiry," Algorithmica, vol. 6, pp. 5-35, 1991.
Dey, S. and S. T. Chakradhar, "Retiming Sequential Circuits to Enhance Testability," 12th IEEE VLSI Test Symposium, pp. 28-33, Apr.1994.

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