Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate
2007-02-27
2007-02-27
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Position or displacement
Position transverse to viewing axis
C356S614000
Reexamination Certificate
active
10363873
ABSTRACT:
In an optical measuring system for determining spatial position and orientation of objects, a plurality of measuring points on the object is registered by cameras, laser measuring devices or a combination thereof. For identifying the measuring points, one target of a specific intensity and/or size or a predetermined pattern (3) of a plurality of targets (4) having specific differing intensities and/or sizes is associated with each measuring point. The intensities and/or sizes of the targets are detected in a pixel image of the target (4) by summing up intensities sensed by pixels included in the image of the target. The targets are light emitting devices consuming differing amounts of energy, reflecting, black or white spots of differing diameter or spots of differing shades of gray or other suitable color.
REFERENCES:
patent: 4764668 (1988-08-01), Hayard
patent: 4813436 (1989-03-01), Au
patent: 4863819 (1989-09-01), Drexler et al.
patent: 5072294 (1991-12-01), Engle
patent: 5260556 (1993-11-01), Lake et al.
patent: 5393970 (1995-02-01), Shau et al.
patent: 5395181 (1995-03-01), Dezse et al.
patent: 5457754 (1995-10-01), Han et al.
patent: 5689340 (1997-11-01), Young
patent: 5724743 (1998-03-01), Jackson
patent: 5734736 (1998-03-01), Palmer et al.
patent: 5809171 (1998-09-01), Neff et al.
patent: 5900930 (1999-05-01), Simon et al.
patent: 5943783 (1999-08-01), Jackson
patent: 5973788 (1999-10-01), Pettersen et al.
patent: 5982352 (1999-11-01), Pryor
patent: 6056911 (2000-05-01), Griffin
patent: 6064762 (2000-05-01), Haenel
patent: 196 32 058 (1998-03-01), None
patent: 197 33 466 (1999-02-01), None
Clarke Timothy Alan
Wang Xinchi
Leica Geosystems AG
Rankin, Hill Porter & Clark LLP
Stafira Michael P.
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