Image analysis – Pattern recognition – Classification
Reexamination Certificate
2006-05-05
2010-06-15
Chang, Jon (Department: 2624)
Image analysis
Pattern recognition
Classification
C382S276000, C382S100000
Reexamination Certificate
active
07738709
ABSTRACT:
Briefly, in accordance with one embodiment, a method of identifying marked content is described. For example, although claimed subject matter is not limited in this respect, in one embodiment, a class-wise non-principal components approach may be employed.
REFERENCES:
patent: 6122628 (2000-09-01), Castelli et al.
Loog et al. “Linear Dimensionality” Reduction via Heteroscedastic Extension of LDA: The Chernoff Criterion. IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 26, No. 6, Jun. 2004, pp. 732-739.
Quintiliano et al. “Detection of Streets based on KLT Using IKONOS Multispectral Images.” 2nd GRSS/ISPRS Joint Workshop on Remote Sensing and Data Fusion over Urban Areas, May 22, 2003, pp. 186-190.
Shi Yun-Qing
Xuan Guorong
Chang Jon
Connolly Bove & Lodge & Hutz LLP
New Jersey Institute of Technology
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