Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate
2007-01-16
2010-11-09
Geisel, Kara E (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
Reexamination Certificate
active
07830506
ABSTRACT:
A method for high spatial resolution examination of a sample, the sample to be examined including a substance that can be repeatedly converted from a first state into a second state, the first and the second states differing from one another in at least one optical property. The method includes: a) bringing the substance into the first state by means of a switching signal in a sample region to be recorded, b)inducing the second state by means of an optical signal, spatially delimited subregions being specifically excluded within the sample region to be recorded, c) reading out the remaining first states, and d) steps a) to c) are repeated, the optical signal being displaced upon each repetition in order to scan the sample, wherein the individual steps a) to d) are carried out in a sequence adapted to the respective measuring situation.
REFERENCES:
patent: 4621911 (1986-11-01), Lanni et al.
patent: 6055097 (2000-04-01), Lanni et al.
patent: 6255642 (2001-07-01), Cragg et al.
patent: 7064824 (2006-06-01), Hell
patent: 7485875 (2009-02-01), Wolleschensky et al.
patent: 2002/0141052 (2002-10-01), Iketaki
patent: 2002/0167724 (2002-11-01), Iketaki et al.
patent: 2006/0038993 (2006-02-01), Hell
patent: 2007/0206276 (2007-09-01), Gugel et al.
patent: 2007/0206278 (2007-09-01), Dyba et al.
patent: 2007/0268583 (2007-11-01), Dyba et al.
patent: 103 25 459 (2004-11-01), None
patent: 103 25 460 (2004-11-01), None
patent: 1584918 (2005-10-01), None
Klar et al., “Breaking Abbe's diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapes”, The American Physical Society, vol. 64, 066613, pp. 1-9.
U.S. Appl. No. 11/653,446, filed Jan. 16, 2007, Dyba et al.
U.S. Appl. No. 11/623,703, filed Jan. 16, 2007, Gugel et al.
U.S. Appl. No. 11/623,690, filed Jan. 16, 2007, Dyba et al.
Dyba Marcus
Gugel Hilmar
Seyfried Volker
Foley & Lardner LLP
Geisel Kara E
Leica Microsystems CMS GmbH
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