Method for heating dynamic memory units whereby

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371 214, 371 27, 371 28, 324158R, 324 731, G11C 2900

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active

052650995

ABSTRACT:
Dynamic memory heating method in which the control lines of the memory unit are excited with pulses at a rate above the maximum rate used for regular memory functions. While data retention, storage and access capabilities disappear at such rates, the memory unit main current supply exhibits higher rate of current spikes which are used for heating the memory unit. This heating effect tends to increase while increasing the rate at the control lines until a maximum point is reached. Further increase of the rate results with reduced overall current consumption which leads to a reduced heating. An automatic system for detecting this maximum rate of pulses controls the maximum heating of the dynamic memory unit.

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patent: 4835458 (1989-05-01), Kim
patent: 4841233 (1989-06-01), Yoshida
"Fundamentals of Testability-A Tutorial" by Fritzmeier et al., IEEE Transactions on Industrial Electronics, vol. 36, No. 2, May 1989, pp. 117-128.

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