Method for grading gemstone cut and symmetry

Optics: measuring and testing – Crystal or gem examination

Reexamination Certificate

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Reexamination Certificate

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11119984

ABSTRACT:
An apparatus and associated method for the direct and objective grading of the cut and symmetry of gemstones is provided. The apparatus comprises a laser, an integration sphere, and a gemstone holder, which together measure certain optical characteristics of the gemstone. Optionally, the gemstone holder mechanically rotates and the integration sphere connects to a data recorder such that a plurality of measurements may be recorded and analyzed. The associated method provides a method for interpretation of the data generated by the apparatus as the data relates to the cut quality and symmetry of the gemstone.

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patent: 5424830 (1995-06-01), Andrychuk
patent: 6239867 (2001-05-01), Aggarwal
patent: 6567156 (2003-05-01), Kerner
patent: 6813007 (2003-06-01), Lapa et al.
patent: 2005/0254037 (2005-11-01), Haske

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