Optics: measuring and testing – Crystal or gem examination
Reexamination Certificate
2007-03-20
2007-03-20
Toatley, Gregory J. (Department: 2877)
Optics: measuring and testing
Crystal or gem examination
Reexamination Certificate
active
11119984
ABSTRACT:
An apparatus and associated method for the direct and objective grading of the cut and symmetry of gemstones is provided. The apparatus comprises a laser, an integration sphere, and a gemstone holder, which together measure certain optical characteristics of the gemstone. Optionally, the gemstone holder mechanically rotates and the integration sphere connects to a data recorder such that a plurality of measurements may be recorded and analyzed. The associated method provides a method for interpretation of the data generated by the apparatus as the data relates to the cut quality and symmetry of the gemstone.
REFERENCES:
patent: 3740142 (1973-06-01), Takubo
patent: 3858979 (1975-01-01), Elbe
patent: 3947120 (1976-03-01), Bar-Issac et al.
patent: 4460211 (1984-07-01), Pomeroy
patent: 4508449 (1985-04-01), Okazaki
patent: 4907875 (1990-03-01), Bowley et al.
patent: 5424830 (1995-06-01), Andrychuk
patent: 6239867 (2001-05-01), Aggarwal
patent: 6567156 (2003-05-01), Kerner
patent: 6813007 (2003-06-01), Lapa et al.
patent: 2005/0254037 (2005-11-01), Haske
Chaney Nathan Price
Henry Mark Murphey
Punnoose Roy M.
Schrantz Stephen Douglas
Toatley Gregory J.
LandOfFree
Method for grading gemstone cut and symmetry does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for grading gemstone cut and symmetry, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for grading gemstone cut and symmetry will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3794918