Patent
1997-03-07
1999-11-30
Teska, Kevin J.
39550003, 39550008, 39550009, 39550012, G06F 1750
Patent
active
059957344
ABSTRACT:
As a method for determining transistor palcement of a cell by using a computer, a degree of integratin of the cell equivalent to manual layout design can be realized and a processing can be performed within a practical time. At a one-dimensional placement step, transistors of the cell are placed in a string with vertical placement state in each channel region. At a two-dimensional placement step, conditions of the one-dimensional placement step are excluded, and the transistors can be placed in a plurality of strings with horizontal placement state in each channel region to strings with horizontal placement state in each channel region to change the transistor placement. Consequently, a result of the transistor placement obtained at the one-dimensional placement step can be improved and the cell can be made more compact. At the one-dimensional placement step, global optimization is performed. At the two-dimensional step, only local improvement of the placement is performed. Therefore, a burden on the computer can be relieved more considerably than in a method for placing transistors in two-dimensions from the beginning, and the processing can be performed within the practical time.
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Matsushita Electric - Industrial Co., Ltd.
Siek Vuthe
Teska Kevin J.
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