Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate
1999-10-25
2004-04-06
Frejd, Russell (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Modeling by mathematical expression
C700S031000
Reexamination Certificate
active
06718288
ABSTRACT:
BACKGROUND OF THE INVENTION
The invention relates to a method for generating semi-empirical transfer functions. An existing design process known as the design for six sigma (DFSS) process focuses on meeting critical to quality (CTQ) parameters by controlling one or more key control parameters (KCP's) and/or key noise parameters (KNP's). In the DFSS process, the transfer functions can be represented as
Y=F
(
X
1
, X
2
, . . . X
); or
CTQ=F
(
KCPs, KNPs
).
The transfer functions may be developed using closed form analyses, numerical analyses, or experimentation. The numerical and experimental methods often use regression analysis and design of experiments. Closed form solutions are generally available for only relatively simple problems. These transfer functions are typically obtained in the DFSS process by brainstorming the relevant parameters and using regression analysis and design of experiments (DOE) to fit these parameters to the numerical analysis or experimental data. The resulting transfer functions are usually in a polynomial form. A drawback to this process is that polynomial transfer functions require relatively large DOE's since the known physical relationships are not used. These resulting equations are cumbersome and provide little insight into physical relationships among the equation parameters.
BRIEF SUMMARY OF THE INVENTION
An exemplary embodiment of the invention is directed to a method for determining a transfer function relating a critical to quality parameter to key parameters in a design for six sigma process. The method includes determining a dimensionless group containing a plurality of key parameters. The key parameters include key control parameters or key noise parameters that have an affect on the critical to quality parameter. A transfer function relating the dimensionless group to the critical to quality parameter is then generated.
REFERENCES:
patent: 5347446 (1994-09-01), Iino et al.
patent: 6253115 (2001-06-01), Martin et al.
patent: 6360131 (2002-03-01), Cheng
patent: 6377908 (2002-04-01), Ostrowski et al.
Furuta et al., K. Disturbance Attenuation Controller Design by Markov Parameters, Processings of the 34th IEEE Conference on Decision and Control, 1995, Dec. 1995, pp. 2962-2967.*
Howze et al., J.W. Robust Tracking, Error Feedback, and Two-Degree-of-Freedom Controllers, IEEE Transactions on Automatic Control, vol. 42, No. 7, Jul. 1997, pp. 980-983.*
Monopoli, R.V. Control of Linear Plants with Zeros and Slowly Varying Parameters, IEEE Transactions on Automatic Control, vol. 12, No. 1, Feb. 1967, pp. 80-83.*
Liu et al., L. Adaptive State Tracking, IEE Proceedings on Control Theory and Applications, vol. 135, No. 6, Nov. 1988, pp. 429-435.*
Mourey et al., M. A Phase Noise Model to Improve the Frequency Stability of Ultra Stable Oscillator, Proceedings of the 1997 IEEE International Frequency Control Symposium, May 1997, pp. 502-508.*
D. Robinson et al., Series Elastic Actuator Development for a Biomimetic Walking Robot, Proceedings of the 1999 IEEE/ASME InternationaL Conference on Advanced Intelligent Mechatronics, Sep. 1999, pp. 561-568.*
R.Jacquot et al., Generalized Gain Plots for Proportiional Digital Control for Second-Order All-Pole Plants, IEEE Control Systems Magazine, Jun. 2000, pp. 80-84.
Cabou Christian G.
Frejd Russell
General Electric Company
Ingraham Donald S.
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