Method for generating test pattern sets during a functional simu

Details Method for generating test pattern sets during a functional simu Method for generating test pattern sets during a functional simu

1994-08-19

1998-07-14

Beausoliel, Jr., Robert W.

G06F 1100

Patent

active

057817189

ABSTRACT:
A method and apparatus are disclosed for generating modular test pattern sets for production testing of a digital circuit. The method comprises the steps of enabling a pattern generator (16) and executing a functional simulation on a functional simulator (18) until a first time mark. The pattern generator (16) is disabled and the state of the registers in the digital circuit (52) are captured using scanning circuitry in the circuit (52). The captured state is stored in a memory (68) external to the digital circuit (52). The pattern generator (16) is then re-enabled and the registers are reloaded from the memory (68) using the scanning circuitry of the circuit (52). The functional simulation is resumed until a second time mark. Whenever the pattern generator (16) is enabled, a pattern is stored on a storage medium (20) in response to a clock controlling the circuit (52) wherein each pattern represents the electrical state of the inputs and outputs of the circuit (52) during a particular clock cycle.

REFERENCES:
patent: 4519078 (1985-05-01), Komonytsky
patent: 4998250 (1991-03-01), Kohlmeier et al.
patent: 5005173 (1991-04-01), Martin
patent: 5282146 (1994-01-01), Aihara et al.
patent: 5291495 (1994-03-01), Udell, Jr.
patent: 5329471 (1994-07-01), Swoboda et al.
patent: 5341314 (1994-08-01), Bencivenga et al.
patent: 5390193 (1995-02-01), Millman et al.
patent: 5475624 (1995-12-01), West
patent: 5502661 (1996-03-01), Glunz
patent: 5535223 (1996-07-01), Horstmann et al.

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