Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Patent
1998-03-18
2000-05-23
Assouad, Patrick
Data processing: measuring, calibrating, or testing
Measurement system
Dimensional determination
324230, G01B 1702
Patent
active
060675098
ABSTRACT:
A method for determining and generating a computer generated picture of the pattern of the thickness of a selected layer of a multi-layer coating on a workpiece at selected locations and taken at a plurality of timed segments, by a Pelt Gage.
REFERENCES:
patent: 5237870 (1993-08-01), Fry et al.
patent: 5271274 (1993-12-01), Khuri-Yakub et al.
patent: 5504695 (1996-04-01), Yoshida et al.
patent: 5528510 (1996-06-01), Kraft
patent: 5557970 (1996-09-01), Abbate et al.
patent: 5737227 (1998-04-01), Greenfield et al.
patent: 5751608 (1998-05-01), Koch et al.
patent: 5893050 (1999-04-01), Park et al.
patent: 5924058 (1999-07-01), Waldhauer et al.
patent: 5930744 (1999-07-01), Koch et al.
Assouad Patrick
Chandler Charles W.
LandOfFree
Method for generating computed statistical control charts from p does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for generating computed statistical control charts from p, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for generating computed statistical control charts from p will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1843615