Method for generating a table model of a device

Details Method for generating a table model of a device Method for generating a table model of a device

1995-07-31

1998-06-30

Teska, Kevin J.

Boots, shoes, and leggings

364488, 364489, G06G 762

Patent

active

057743827

ABSTRACT:
A method (10) for generating a table (26', 26") having independent (C.sub.L, e.sub.r) and dependent (P.sub.D) table model parameters is provided. An initial table (26) is generated by measuring actual values of the dependent table model parameters (P.sub.D) for corresponding independent table model parameters (C.sub.L, e.sub.r) and inserting the actual values into the initial table (26). Calculated table model parameters are generated by calculating values of the dependent table model parameters (P.sub.D) corresponding to independent table model parameters (C.sub.L, e.sub.r), wherein the corresponding independent table model parameters (C.sub.L, e.sub.r) are between the measured independent table model parameters (C.sub.L, e.sub.r). The calculated values are compared to measured values and if an error value exceeds a predetermined error tolerance level, the initial table (26) is updated by inserting the actual values of the dependent table model parameters (P.sub.D) for corresponding independent table model parameters (C.sub.L, e.sub.r).

REFERENCES:
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patent: 5047971 (1991-09-01), Horwitz
patent: 5051911 (1991-09-01), Kimura et al.
patent: 5282148 (1994-01-01), Poirot et al.
patent: 5373457 (1994-12-01), George et al.
patent: 5467291 (1995-11-01), Fan et al.
Kao, Ansari and Chan. "An Automatic Characterization System for Standard Cells", IEEE 1987 Custom Integrated Circuits Conference, pp. 359-362.

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