Semiconductor device manufacturing: process – Laser ablative material removal
Patent
1996-12-05
1999-02-23
Jones, Deborah
Semiconductor device manufacturing: process
Laser ablative material removal
438707, 438743, 438744, 3613213, 3613214, 361322, C03C 2506
Patent
active
058743693
ABSTRACT:
Vias are formed in a dielectric film overlying an electrode layer by sweeping a laser beam over the area in which the via is to be formed. In particular, a Nd:YAG laser, producing a beam of light having a 266 nm wave length, effectively ablates a barium strontium titanate dielectric film, without adversely affecting an underlying platinum electrode. The present invention overcomes the problem of wet chemical etching of dielectric films to form vias. Wet chemical etching often requires etchants that adversely affect the underlying metal electrode and typically require the use of environmentally undesirable chemicals.
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Farooq Mukta Shaji
LaPlante Mark Joseph
Blecker Ira D.
International Business Machines - Corporation
Jones Deborah
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