Method for forming thin film pattern

Radiation imagery chemistry: process – composition – or product th – Imaged product – Multilayer

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430 17, 430 18, 430198, 430325, 427 64, 427162, 427165, 427226, 427261, 427265, 427266, 427287, 4274071, 4274192, 427510, 427515, 427145, G08C 1100, B05D 500

Patent

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058636790

ABSTRACT:
The present invention provides a method for forming a thin film pattern having an excellent accuracy of the pattern. The method comprises the steps of:

REFERENCES:
patent: 4715929 (1987-12-01), Ogawa
patent: 5021398 (1991-06-01), Sharma
patent: 5077085 (1991-12-01), Schnur

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