Method for forming thin film capacitors

Coating processes – Electrical product produced – Condenser or capacitor

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427 80, 427125, 427 97, 427534, 427555, 29 2542, 438381, 438387, 438396, 438706, B05D 512

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059120444

ABSTRACT:
Thin film capacitors are formed by a multi-level dry processing method that includes simultaneous ablation of via openings through both the dielectric and the metal electrode layers of a capacitor. Preferably, the dielectric films are formed of barium strontium titanate and the metal electrode layers are formed of platinum. The present invention overcomes the problems associated with the use of strong etchants to sequentially form separate via openings through the electrode and dielectric layers, prevents the potential for delamination of the respective layers during wet etching and the possible undesirable effects of etching solutions on substrate materials.

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"Integrated, Low Inductance, Small Area Capacitors for VLSI Semiconductor Packages," IBM Technical Disclosure Bulletin, vol. 25, No. 2, Jul. 1982, pp. 883-888.
"Directly Attached Decoupling Capacitors and Fabrication Process," IBM Technical Disclosure Bulletin, vol. 32, No. 6B, Nov. 1989, pp. 330-331.

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