Method for forming suspended microstructures

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor

Reexamination Certificate

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C117S084000, C117S094000

Reexamination Certificate

active

06821342

ABSTRACT:

FIELD OF THE INVENTION
This invention relates generally to a method for forming suspended microstructures and more specifically to a method for forming suspended microstructures using ion implantation.
BACKGROUND OF THE INVENTION
Semiconductor devices continue to shrink in size while growing exponentially in function. One class of small-scale semiconductor devices is microelectromechanical systems (MEMS), which are gaining ever-growing popularity in the microelectronics industry. MEMS are semiconductor device systems that include one or more microstructures, that is, structures of the size on the order of sub-&mgr;m to millimeters. MEMS systems typically are fabricated using micromachining technology that includes a number of intricate, and often costly, processing and fabrication steps that are conducted on a very small, microscopic scale.
A variety of MEMS devices, such as microbeams, membranes, capacitive-type sensors, microhinges, and microvalves, utilize or are fabricated from suspended microstructures. Such suspended microstructures are typically formed using micromachining technology that includes grinding and polishing processes or wet chemical etching processes. However, grinding and polishing processes may be prone to wafer breakage and may result in microstructures having non-uniform thicknesses over the cavities from which they are suspended. Wet chemical etching processes may be time consuming, thus increasing production costs and reducing throughput, and may leave an etch stop layer behind. The etch stop layer may not be desirable and may need to be removed by a non-selective etch.
Accordingly, a need exists for a method for forming suspended microstructures from a monocrystalline substrate using ion implantation.


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patent: 6225190 (2001-05-01), Bruel et al.
“Fabrication of Silicon and Oxide Membranes Over Cavities Using Ion-Cut Layer Transfer”, Chang-Han and Nathan W. Cheung, Journal of Microelectromechanical Systems, vol. 9, No. 4, p. 474-477, (Dec. 2000).
“Fundamentals of Microfabrication”, Marc J. Madou, p, 249-250, (1997).
“A Lower Bound On Implant Density To Induce Wafer Splitting In Forming Compliant Substrate Structures,” L. B. Freund, Applied Physics Letter, vol. 70, No. 26, p. 3519-3521, (Jun. 1997).
“The History, Physics, and Applications of the Smart-Cut® Process,” Michel Bruel, MRS Bulletin, p. 35-39, (Dec. 1998).
“A ‘Smarter-cut’ approach to low temperature silicon layer transfer”, Q.Y. Tong et al, Applied Physics Letter, vol. 72, No. 1, p-49-51, (Jan. 1998).

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