Method for forming self-aligned contacts and local...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S773000, C257S758000, C257S315000, C257SE23145, C438S233000, C438S229000, C438S631000

Reexamination Certificate

active

07382054

ABSTRACT:
The present invention relates generally to semiconductors, and more specifically to semiconductor memory device structures and an improved fabrication process for making the same. The improved fabrication process allows the self-aligned contacts and local interconnects to the processed simultaneously. The process allows the minimal distance requirement between the self-aligned contacts and the local interconnects to be widened, which makes the patterning of self-aligned contacts and local interconnects easier. The widened minimal distance requirement also allows further memory cell shrinkage. The improved structures of self-aligned contacts and local interconnects also have excellent isolation characteristic.

REFERENCES:
patent: 6197670 (2001-03-01), Park
patent: 6482699 (2002-11-01), Hu et al.
patent: 6881659 (2005-04-01), Park et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for forming self-aligned contacts and local... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for forming self-aligned contacts and local..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming self-aligned contacts and local... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2798285

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.