Fishing – trapping – and vermin destroying
Patent
1994-03-18
1996-01-09
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
437 60, 437919, H01L 2700, H01L 2170
Patent
active
054828821
ABSTRACT:
A MOST capacitor for use in a DRAM cell by using non-uniform silicide formations on polysilicon to define a plurality of polysilicon pillars. Unreacted polysilicon islands are used as a mask to selectively form the pillars in the polysilicon electrode layer.
REFERENCES:
patent: 4859622 (1989-08-01), Eguchi
patent: 5068199 (1991-11-01), Sandhu
patent: 5110752 (1992-05-01), Lu
patent: 5134086 (1992-07-01), Ahn et al.
patent: 5158905 (1992-10-01), Ahn
patent: 5164881 (1992-11-01), Ahn
patent: 5182232 (1993-01-01), Chhabra et al.
patent: 5204280 (1993-04-01), Dhong et al.
patent: 5213992 (1993-05-01), Lu
patent: 5227322 (1993-07-01), Ko et al.
patent: 5244842 (1993-09-01), Cathey et al.
patent: 5254503 (1993-10-01), Kenney
patent: 5256587 (1993-10-01), Jun et al.
patent: 5302540 (1994-04-01), Ko et al.
patent: 5304828 (1994-04-01), Kim et al.
patent: 5308786 (1994-05-01), Lur et al.
patent: 5313100 (1994-05-01), Ishii et al.
patent: 5332696 (1994-06-01), Kim et al.
patent: 5342800 (1994-08-01), Jun et al.
patent: 5350707 (1994-09-01), Ko et al.
Wolf et al., Silicon Processing For the VLSI Era, vol. I, Lattice Press 1986, pp. 400-401, 581.
Jun et al., The Fabrication and Electrical Properties of Modulated Stacked Capacitor for Advanced DRAM Applications, IEEE (1992).
IBM Technical Disclosure, Method of Increasing Capacitance Area Using RIE Selectivity, vol. 35, No. 7 (Dec. 1992).
Chen Pin-Iuh
Lur Water
Wu Jiunn-Yuan
Chaudhuri Olik
Tsai H. Jey
United Microelectronics Corporation
LandOfFree
Method for forming most capacitor using polysilicon islands does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for forming most capacitor using polysilicon islands, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming most capacitor using polysilicon islands will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1302801