Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2007-04-24
2007-04-24
Tran, Andrew Q. (Department: 2824)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C257S421000, C365S158000, C365S173000, C365S171000, C365S066000
Reexamination Certificate
active
11148396
ABSTRACT:
A magneto-resistive memory comprising magneto-resistive memory cells is disclosed, comprising a pinned magnetic layer and a free magnetic layer. The two magnetic layers are formed having widened regions at the ends of the layers. As such, the shape made out by the magneto-resisitve memory, from a top-view perspective, is wide at the ends and narrower at the mid-, forming an I shape in one preferred embodiment. The end portions of the free magnetic layer are allowed to magnetically couple to the end portions of the pinned magnetic layer such that magnetic coupling is shifted to these widened regions and coupling in the mid-portion between the widened regions is minimized. Thus, the influence of the pinned magnetic layer on the magnetization orientation of the mid-portion of the free magnetic layer is substantially eliminated, allowing for increased predictability in switching behavior and increased write selectivity of memory cells.
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Arrott Anthony
Drewes Joel
Lu Yong
Zhu Theodore
Knobbe Martens Olson & Bear LLP
Micro)n Technology, Inc.
Tran Andrew Q.
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