Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Reexamination Certificate
2007-07-24
2007-07-24
Huynh, Andy (Department: 2818)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Optical characteristic sensed
C430S008000, C430S259000, C430S439000
Reexamination Certificate
active
11322750
ABSTRACT:
A method for forming a LOCOS layer in a semiconductor device includes steps of oxidizing a high voltage region of the semiconductor device to form a LOCOS layer in the high voltage region; and etching the LOCOS layer according to a pattern.
REFERENCES:
patent: 4908328 (1990-03-01), Hu et al.
patent: 5369052 (1994-11-01), Kenkare et al.
Photolithography ( 7 pages ) from website of Answer .com.
Lithography ; except from chapter 12 of the book by Stanley Wolf ( 3 pages ) Lattice Press ( edition 2000).
Dongbu Electronics Co. Ltd.
Fortney Andrew D.
Huynh Andy
Nguyen Thinh T
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