Method for forming isolated regions of silicon utilizing reactiv

Metal treatment – Compositions – Heat treating

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29576W, 29578, 29580, 148175, 148187, 156643, 156648, 156649, 156653, 156662, 204192E, 204192EC, 357 49, 357 50, H01L 2176, H01L 2700

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041040864

ABSTRACT:
A method for isolating regions of silicon involving the formation of openings that have a suitable taper in a block of silicon, thermally oxidizing the surfaces of the openings, and filling the openings with a dielectric material to isolate regions of silicon within the silicon block. The method is particularly useful wherein the openings are made through a region of silicon having a layer of a high doping conductivity.

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Doo et al., "Making Monolithic . . . Insulation Isolation Techniques", I.B.M. Tech. Discl. Bull., vol. 8, No. 4, Sep. 165, pp. 659-660.
Abbas; S. A., "Recessed Oxide Isolation Process", Ibid., vol. 20, No. 1, Jun. 1977, pp. 144-145.
Bondur; J. A., "Dry Process Tech. Creative Ion Etching", J. Vac. Sci. Technol., vol. 13, No. 5, Sep./Oct. 1976, pp. 1023-1029.
Bersin; R. L., "Survey of Plasma-Etching Processes", Solid State Technol., May, 1976, pp. 31-36.

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