Method for forming dielectric

Coating processes – Direct application of electrical – magnetic – wave – or... – Chemical vapor deposition

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4272481, 427256, B05D 500

Patent

active

054514355

ABSTRACT:
A method of forming a planarized or smoothed dielectric or other material layer upon a partially fabricated intergrated circuit is disclosed. Conventional planarization techniques involve deposition of a dielectric or other material layer followed by anisotropic etchback. Unfortunately, some commercial equipment tends to etch the center of the wafer faster than the edges. The disclosed process forms a layer which is thicker in the central region than the edge region. Thus, when the disclosed process is followed by a conventional etchback, a planar dielectric or other material layer over the entire wafer is formed. Other aspects of the invention include processes and apparatus for producing smooth deposition and etching by control of the impedance of the etching and/or chemical precursor gases.

REFERENCES:
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patent: 4590042 (1986-05-01), Drage
patent: 4654106 (1987-03-01), Davis et al.
patent: 4780169 (1988-10-01), Stark et al.
patent: 4792378 (1988-12-01), Rose et al.
patent: 4803947 (1989-02-01), Ueki et al.
patent: 5000113 (1991-03-01), Wang et al.

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