Method for forming connection pin, probe, connection pin,...

Details Method for forming connection pin, probe, connection pin,... Method for forming connection pin, probe, connection pin,...

2006-03-08

2009-12-08

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S761010

Reexamination Certificate

active

07629806

ABSTRACT:
A probe which can be easily formed, is not limited in a mounting position and number, and capable of sufficiently securing a space allowing a contact to move is provided. The probe has a contact to be brought into contact with an inspection object, and a beam part supporting the contact at a tip end portion. A rear portion of the beam part of the probe is joined to a surface at an inspection object side, of a contractor disposed to be opposed to the inspection object. The beam part of the probe is bent so that the above described contact at the tip end portion inclines to the above described inspection object side.

REFERENCES:
patent: 2007/0089551 (2007-04-01), Williams et al.
patent: 2008/0150558 (2008-06-01), Amemiya et al.
patent: 8-2617 (1996-01-01), None
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patent: 2000-077477 (2000-03-01), None
patent: 2000-346878 (2000-12-01), None
patent: 2003-215161 (2003-07-01), None
patent: 2004-117215 (2004-04-01), None
patent: 2004-340617 (2004-12-01), None
patent: 2004-356467 (2004-12-01), None
patent: WO 96/15458 (1996-05-01), None

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