Method for forming capacitor electrode having jagged surface

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438253, 438255, 438396, 148DIG14, H01L 2120

Patent

active

058588531

ABSTRACT:
In a method for forming a capacitor, after preparing a substrate having at least one device area thereon, an amorphous silicon film containing one type of dopant is formed on the device area. A mask layer comprising mask islands is formed and distributed on a surface of the amorphous silicon film. The surface of the amorphous silicon is dry-etched by using the mask layer as a selective etching mask to produce a jagged surface having a lot of protrusions. After forming the jagged surface, the amorphous silicon film is changed into a polycrystalline silicon film serving as a storage electrode. Finally, a dielectric film and then another storage electrode are formed sequentially on the jagged surface of the storage electrode.

REFERENCES:
patent: 5110752 (1992-05-01), Lu
patent: 5182232 (1993-01-01), Chhabra et al.
patent: 5256587 (1993-10-01), Jun et al.
patent: 5290729 (1994-03-01), Hayashide et al.
patent: 5302540 (1994-04-01), Ko et al.
patent: 5318920 (1994-06-01), Hayashide
patent: 5387531 (1995-02-01), Rha et al.
patent: 5427974 (1995-06-01), Lur et al.
patent: 5466626 (1995-11-01), Armacost et al.
patent: 5474949 (1995-12-01), Hirao et al.
patent: 5474950 (1995-12-01), Kim
patent: 5543347 (1996-08-01), Kawano et al.
Watanabe et al., "Hemispherical Grained Silicon (HSG-Si) Formation on In-Situ Phosphorous . . . Method", Extd. Abs. of the 1992 Int'l. Conf. on Solid State Devs. & Mtls., Tsukuba, 1992, pp. 422-424.
Watanabe et al., "Device application and structure observation for hemispherical-grained Si", J. Appl. Phys., vol. 71, No. 7, Apr. 1, 1992, pp. 3538-3543.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for forming capacitor electrode having jagged surface does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for forming capacitor electrode having jagged surface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming capacitor electrode having jagged surface will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1515079

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.