Method for forming an ultrafine metal pattern using an electron

Fishing – trapping – and vermin destroying

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437228, 437229, 437928, 437935, 148DIG46, 430323, 430324, 2504921, 2504923, H01L 2100, H01L 2102, H01L 21306

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051478234

ABSTRACT:
In a method for forming a pattern, by selectively irradiating a charged particle beam onto a substrate in an atmosphere containing a raw material gas, a resist pattern comprising a material which is produced on the substrate from the raw material gas is formed, wherein a pressure of the raw material gas is set to 10.sup.-7 to 10.sup.-5 Torr, an accelerating voltage of the charged particle beam is set to 0.5 to 6 kV, and a beam current of the charged particle beam is set to 10.sup.-13 to 10.sup.-7 A. Thus, a resist pattern of an ultrafine width can be stably formed in a relatively short time.
Further, in a method for forming a pattern, by irradiating a charged particle beam onto a substrate in an atmosphere containing a gaseous negative type resist, a cross-linking reaction of the negative type resist molecules adsorbed on the surface of the substrate is caused, and a pattern comprising the negative type resist molecules which caused the cross-linking reaction is formed, so that a pattern which has an ultrafine width and can be easily removed by the wet process can be formed.

REFERENCES:
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patent: 4197332 (1980-04-01), Broers et al.
patent: 4357183 (1982-11-01), Fan et al.
patent: 4566937 (1986-01-01), Pitts
Wolf, S., Silicon Processing for the VLSI Era, vol. 1, pp. 420-421, 1986, Lattice Press.
Gangal, S., Plasma-Poly. Electron Beam Resist Prepar. from Methyl Metacrylate Using Various Carrier Gases, pp. 341-350, Thin Solid Films, 149 (1987).
Morrissey, J., Electron-Beam Contaminantion as a Mask, IBM Tech. Discl. Bull., vol. 20, No. 6, Nov. 1977, p. 2212.
Japanese Patent Abstract, vol. 10, No. 150, (E-408) [2207], May 31, 1986, (11) 61-10241 (A).
IBM Technical Disclosure Bulletin, vol. 20, No. 6 Nov. 1977.

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