Method for forming aluminum oxide dielectric isolation in integr

Metal working – Method of mechanical manufacture – Assembling or joining

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29578, 29580, 148175, 148187, 148DIG85, 148DIG117, 204 15, 204 345, 204 42, 20412935, 357 40, 357 49, 357 50, H01L 2120, H01L 2176

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045425795

ABSTRACT:
In the fabrication of integrated circuits, a method is provided for forming dielectrically isolated regions in a semiconductor substrate comprising forming over the semiconductor substrate surface an electrically insulating layer of dielectric material having a plurality of openings therethrough and etching to form recesses in the semiconductor substrate exposed in the openings. Then, aluminum is deposited over the substrate so that an aluminum layer is formed on said layer of dielectric material as well as in said recesses. Next, the aluminum in the recesses is selectively anodized to form aluminum oxide, and the remaining aluminum on said layer of dielectric material is removed either by selectively etching away the aluminum layer or by a "lift-off" technique wherein the insulating layer of dielectric material under the aluminum is etched away thereby "lifting-off" and removing the aluminum.

REFERENCES:
patent: 3386865 (1968-06-01), Doo
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patent: 3539876 (1970-11-01), Feinberg et al.
patent: 3634203 (1972-01-01), McMahon et al.
patent: 3671819 (1972-06-01), Swanson
patent: 3723258 (1973-03-01), Podell et al.
patent: 3919060 (1975-11-01), Pogge et al.
patent: 4005452 (1977-01-01), Cook
Cook et al., "Anodic Aluminum Isolation", Proc. Electron Devices Mtg., Wash., D.C., Nov. 17, 1974, pp. 266-269.
Doo et al., "Making Monolithic . . . Isolation Techniques", I.B.M. Tech. Discl. Bull., vol. 8, No. 4, Sep. 1965, pp. 659-660.
Deines, J. L., "Device Etching for Microscope Sample Preparation", I.B.M. Tech. Discl. Bull., vol. 15, No. 2, Jul. 1972, pp. 682-683.

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