Coating apparatus – Gas or vapor deposition – With treating means
Patent
1991-04-18
1993-01-12
Hearn, Brian E.
Coating apparatus
Gas or vapor deposition
With treating means
156345, 156643, 20429825, H01L 2100
Patent
active
051786826
ABSTRACT:
A method and apparatus for manufacturing a semiconductor device having a thin layer of material formed on a semiconductor substrate with a much improved interface between them are disclosed. A silicon substrate is heated up to a temperature around 300.degree. C. in the presence of ozone gas under exposure to UV light. Through this process, organic contaminants that might be present on the surface of the silicon substrate are dissipated by oxidation, and a thin oxide film is formed on the substrate surface on the other. The silicon substrate with the thin oxide film coated thereon is then heated up to temperatures of 200.degree.-700.degree. C. in the presence of HCl gas under illumination to UV light to strip the oxide film off the substrate surface, thereby exposing the cleaned substrate surface. Finally, HCl cleaned surface of the silicon substrate is coated with a thin layer of material such as monocrystalline silicon without exposing the cleaned substrate surface. The method provides a semiconductor with the thin layer of material formed thereon having a well-controlled, well organized interface between them.
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Tokui Akira
Tsukamoto Katsuhiro
Goudreau George
Hearn Brian E.
Mitsubishi Denki & Kabushiki Kaisha
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