Method for forming a thin film transistor

Fishing – trapping – and vermin destroying

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437 21, 437 52, 148DIG109, H01L 21786

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active

055102786

ABSTRACT:
An under-gated thin film transistor (54) having low leakage current and a high on/off current ratio is formed using a composite layer (40) of semiconducting material. In one embodiment a composite layer (40) of semiconducting layer is formed by depositing two distinct layers (34, 38) of semiconducting material over the transistor gate electrode (18). The composite layer (40) is then patterned and implanted with ions to form a source region (46) and a drain region (48) within the composite layer (40), and to define a channel region (50) and an offset drain region (52) within the composite layer (40).

REFERENCES:
patent: 4463492 (1984-08-01), Maeguchi
patent: 4554572 (1985-11-01), Chatterjee
patent: 4808555 (1989-02-01), Mauntel et al.
patent: 5039622 (1991-08-01), Ishihara
patent: 5100816 (1992-03-01), Rodder
patent: 5156987 (1992-10-01), Sandhu et al.
patent: 5198379 (1993-03-01), Adan
patent: 5212399 (1993-05-01), Manning
patent: 5248623 (1993-09-01), Muto et al.
patent: 5266507 (1993-11-01), Wu
patent: 5330929 (1994-07-01), Pfiester et al.
patent: 5334862 (1994-08-01), Manning et al.
patent: 5393682 (1995-02-01), Liu

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