Method for forming a nitride layer using preheated ammonia

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437225, 437190, 437245, H01L 2144

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051889790

ABSTRACT:
A process for forming a titanium nitride barrier layer in semiconductor devices using preheated ammonia reduces susceptibility to junction spiking. In one form of the invention, a substrate having an overlying layer of titanium is heated to a predetermined temperature in a reaction chamber. An ammonia gas is preheated to temperature not less than 600.degree. C. and is introduced into the reaction chamber. The preheated ammonia gas and the titanium layer react to form a quality titanium nitride (TiN) layer which is highly resistant to the junction spiking phenomenon. Nitride layers of other Group IVB or Group VB elements of the periodic table may also be formed using the present invention.

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patent: 4784973 (1988-11-01), Stevens et al.
patent: 4920071 (1990-04-01), Thomas
patent: 5002646 (1991-03-01), Egerton et al.
patent: 5021134 (1991-06-01), Blackburn et al.
patent: 5043300 (1991-08-01), Nulman

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