Method for forming a modified semiconductor having a...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Making emissive array

Reexamination Certificate

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C372S050121

Reexamination Certificate

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10510357

ABSTRACT:
A method for forming a modified semiconductor having a number of band gaps involves providing a semiconductor having a surface and a quantum region which emits photons in response to electrical or optical stimulation, the quantum region having an original band gap and being disposed under the surface and applying a number of layers of a number of materials to a number of selected regions of the surface, the materials being adapted to cause, upon thermal annealing, a number of different degrees of intermixing in a number of portions of the quantum region disposed immediately below each of the selected regions of the surface. The layers of materials can be applied in a dot or line pattern, or both, to increase the plurality of band gap tuning. The method includes thermally annealing the layers to the surface. The methods result in a modified semiconductor which exhibits a number of different band gaps in a number of portions of the quantum region depending upon the positioning of the layers of materials on the surface immediately above the respective portions of the quantum region.

REFERENCES:
patent: 4731338 (1988-03-01), Ralston et al.
patent: 4751194 (1988-06-01), Cibert et al.
patent: 4865923 (1989-09-01), Ralston et al.
patent: 5238868 (1993-08-01), Elman et al.
patent: 5395793 (1995-03-01), Charbonneau et al.
patent: 5399900 (1995-03-01), Ko et al.
patent: 5708674 (1998-01-01), Beernink et al.
patent: 5757023 (1998-05-01), Koteles et al.
patent: 5764669 (1998-06-01), Nagai
patent: 5766981 (1998-06-01), Thornton et al.
patent: 5815522 (1998-09-01), Nagai
patent: 5832019 (1998-11-01), Paoli et al.
patent: 5843802 (1998-12-01), Beernink et al.
patent: 5886370 (1999-03-01), Sun et al.
patent: 5915165 (1999-06-01), Sun et al.
patent: 6005881 (1999-12-01), Ikoma
patent: 6027989 (2000-02-01), Poole et al.
patent: 6238944 (2001-05-01), Floyd
patent: 6514784 (2003-02-01), Dubowski
patent: 2001/0041379 (2001-11-01), Sakata
patent: 2002/0003918 (2002-01-01), Ooi et al.
patent: 2002/0004253 (2002-01-01), Ooi et al.
patent: 2358281 (2001-07-01), None
patent: 2369492 (2002-05-01), None
patent: 2409333 (2005-06-01), None
Deppe, D.G. et al., “Atom diffusion and impurity-induced layer disordering in quantum well III-V semiconductor heterostructures.”J. Appl. Phys.vol. 64 (12), Dec. 15, 1988, pp. R93-R113.
Ooi, Boon Siew et al., “Selective Quantum-Well Intermixing in GaAs-AlGaAs Structures Using Impurity-Free Vacancy Diffusion.”Ieee Journal of Quantum Electronics, vol. 33, No. 10, Oct. 1997, pp. 1784-1793.
Choi, W.J. et al., “Dependence of Dielectric-Cap Quantum-Well Disordering of GaAs-AlGaAs Quantum-Well Structure on the Hydrogen Content in SiNxCapping Layer.”Ieee Journal of Selected Topics in Quantum Electronics, vol. 4, No. 4, Jul./Aug. 1998, pp. 624-628.
Teng, J.H. et al., “Control of the band-gap shift in quantum-well intermixing using a germanium interlayer.”Applied Physics Letters. vol. 76, No. 12, Mar. 20, 2000, pp. 1582-1584.
Marsh, J.H. et al., “Quantum well intermixing in material systems for 1.5 μm (invited).”J. Vac. Sci. Technol. Avol. 16(2), Mar./Apr. 1998, pp. 810-816.

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