Method for forming a dielectric filled trench

Fishing – trapping – and vermin destroying

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937241, H01L 2176

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active

049607278

ABSTRACT:
A structure and method for forming an isolation wall in an etched trench are described. The trench walls are covered by a thin silicon oxide layer and the trench conformally filled with an oxy-nitride mixture having a particular range of composition so as to produce a neutral to slight tensile stress in the oxy-nitride relative to silicon. The structure is very simple to fabricate and creates fewer defects in the silicon substrate than prior art techniques. Buried voids in the filled trench are eliminated.

REFERENCES:
patent: 3859716 (1975-01-01), Tihanyi
patent: 3883889 (1975-05-01), Hall
patent: 4113515 (1978-09-01), Kooi et al.
patent: 4131910 (1978-12-01), Hartman et al.
patent: 4148133 (1979-04-01), Kochel et al.
patent: 4192059 (1980-03-01), Khan et al.
patent: 4438157 (1984-03-01), Romano-Moran
patent: 4454646 (1984-06-01), Joy et al.
patent: 4454647 (1984-06-01), Joy et al.
patent: 4471525 (1984-09-01), Sasaki
patent: 4545852 (1985-10-01), Barton
patent: 4571819 (1986-02-01), Rogers et al.
patent: 4580330 (1986-04-01), Pollack et al.
patent: 4621414 (1986-11-01), Iranmanesh
patent: 4737831 (1988-04-01), Iwai
patent: 4791073 (1988-12-01), Nagy et al.
Wolf et al., Silicon Processing for the VLSI Era, vol. 1, Lattice Press, Sunset Beach, CA, p. 195.
Barton et al., "A Two Level Metal CMOS Process for VLSI Circuits", Semiconductor International, Jan. 1985, pp. 98-102.
Gaind et al., "Physicochemical Properties of Chemical Vapor-Deposited Silicon Oxynitride from a SiH.sub.4 --CO.sub.2 --NH.sub.3 --H.sub.2 System" Solid State Sci & Technology, vol. 125, No. 1, Jan. 18, pp. 139-145.
Maeyama et al., "Surface Silicon Crystallinity and Anomalous Composition Profiles of Buried SiO.sub.2 and Si.sub.3 N.sub.4 Layers Fabricated by Oxygen and Nitrogen Implantation in Silicon" Japanese Journal of Applied Science, vol. 21, No. 5, May 1982, pp. 744-751.
Burkhardt, "Composite Silicon Dioxide-Silicon Oxynitride Insulating Layer" IBM Tech. Disc. Bulletin, vol. 13, No. 1, Jun. 1970.

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