Method for forming a capacitor in a semiconductor and a...

Semiconductor device manufacturing: process – Making passive device – Planar capacitor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21011, C257SE29343, C216S006000

Reexamination Certificate

active

07745300

ABSTRACT:
Disclosed is a capacitor and method for forming a capacitor in a semiconductor. The method includes the steps of: (a) forming a lower electrode pattern on a silicon semiconductor substrate; (b) etching a portion of the lower electrode pattern to a predetermined depth to form a step in the lower electrode pattern; (c) forming a dielectric layer and a upper electrode layer on an entire surface of the substrate including the lower electrode pattern; and (e) patterning the upper electrode layer and the dielectric layer to form a upper electrode pattern and a dielectric pattern.

REFERENCES:
patent: 5814526 (1998-09-01), Tseng
patent: 6333224 (2001-12-01), Lee
patent: 6492224 (2002-12-01), Jao
patent: 2001/0022292 (2001-09-01), Hartner et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for forming a capacitor in a semiconductor and a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for forming a capacitor in a semiconductor and a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming a capacitor in a semiconductor and a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4228302

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.