Method for finding cause of abnormal event in support of plant o

Details Method for finding cause of abnormal event in support of plant o Method for finding cause of abnormal event in support of plant o

1996-02-23

1998-08-25

MacDonald, Allen R.

Data processing: artificial intelligence

Knowledge processing system

Knowledge representation and reasoning technique

706 45, 706 50, 706 52, 706 55, G06F 1700

Patent

active

057992940

ABSTRACT:
The accuracy of finding a cause from factors cited by means of a MYCIN method by narrowing down such factors is improved. With respect to deriving events which would not possibly occur if a particular factor 10C among a plurality of factors is a cause of abnormal event 100C, negative deriving events 12C and 1MC negating these deriving events of the other factors which would not occur with factor 10C being the cause are added to a fault tree chart as deriving events of factor 10C.

REFERENCES:
patent: 5127005 (1992-06-01), Oda et al.
patent: 5305426 (1994-04-01), Ushioda et al.
patent: 5369756 (1994-11-01), Imura et al.
Rai, Suresh. "A Direct Approach to Obtain Tighter Bounds for Large Fault Trees with Repeated Events," Jan. 1994 Proceedings Annual Reliability and Maintainability Symposium, pp. 475-480.

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