Image analysis – Pattern recognition – Classification
Patent
1998-01-26
2000-08-08
Tran, Phuoc
Image analysis
Pattern recognition
Classification
382227, 382240, G06K 936, G06K 946, G06K 968
Patent
active
061012750
ABSTRACT:
A fast way for determining the best subset test for a nominal attribute in a decision tree. When a nominal attribute has n distinct values, the prior art requires computing the impurity functions on each of the 2.sup.n-1 -1 possible subset partitioning of the n values and finding the minimum case among them. This invention guarantees the minimum impurity test on the attribute by computing only (n-1) impurity function computations. This reduction of computational complexity makes it practically possible to find the true best tests for many real data mining application, where a binary decision tree is used as the classification model.
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Coppersmith Don
Hong Se June
Hosking Jonathan R. M.
International Business Machines - Corporation
Kaufman, Esq. Stephen C.
Mariam Daniel G.
Tran Phuoc
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