Fishing – trapping – and vermin destroying
Patent
1990-05-29
1992-01-28
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
437192, 437193, 437196, 437200, 437203, 437229, H01L 21285
Patent
active
050844130
ABSTRACT:
A method for filling a contact hole in which (i) a silicon dioxide layer is formed on a silicon substrate; (ii) a contact hole is formed in the silicon dioxide layer; (iii) polysilicon film is formed on the side and bottom surface portions of the contact hole; (iv) gas containing tungsten reacts with the film; and (v) the contact hole is filled up with tungsten.
REFERENCES:
patent: 3881242 (1975-05-01), Nuttall et al.
patent: 4107726 (1978-08-01), Schilling
patent: 4253888 (1981-03-01), Kikuchi
patent: 4343676 (1982-08-01), Tarng
patent: 4349408 (1982-09-01), Tarng et al.
patent: 4403392 (1983-09-01), Oshima et al.
patent: 4443930 (1984-04-01), Hwang et al.
patent: 4473598 (1984-09-01), Ephrath et al.
patent: 4481706 (1984-11-01), Roche
patent: 4540607 (1985-09-01), Tsao
patent: 4587710 (1986-05-01), Tsao
patent: 4589196 (1986-05-01), Anderson
patent: 4589928 (1986-05-01), Dalton et al.
patent: 4673592 (1987-06-01), Porter et al.
patent: 4676847 (1987-06-01), Lin
patent: 4720908 (1988-01-01), Wills
Saraswat et al., "Selective CVD of Tungsten for VLSI Technology", VLSI Science & Technology, Proceedings, vol. 84, 1984, pp. 409-419.
Brors et al., "Properties of Low Pressure CVD Tungsten Silicide . . . ", Solid State Technology; Apr. 1983, pp. 183-186.
Ghandhi, "VLSI Fabrication Principles," John Wiley & Sons, New York, NY, 1983, pp. 435-439.
Smith, "CVD Tungsten Contact Plugs by In Situ Deposition and Etchback", V-MIC Conf., 1985, pp. 350-356.
Stacy et al., "Interfacial . . . Tungsten Layers Formed by Selective Low Pressure Chemical Vapor Deposition," J. Electrochem. Soc., vol. 132, No. 2, Feb. 1985, pp. 444-447.
Broadbent et al., "Selective Low Pressure Chemical Vapor Deposition of Tungsten," J. Electrochem. Soc., vol. 131, No. 6, Jun. 1984, pp. 1427-1433.
Fujita Tsutomu
Kakiuchi Takao
Tanimura Shoichi
Yamamoto Hiroshi
Chaudhuri Olik
Matsushita Electric - Industrial Co., Ltd.
Wilczewski M.
LandOfFree
Method for filling contact hole does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for filling contact hole, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for filling contact hole will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1860892