Method for fault tracing in electronic measurement and test...

Details Method for fault tracing in electronic measurement and test... Method for fault tracing in electronic measurement and test...

2006-02-07

2006-02-07

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S439000

Reexamination Certificate

active

06995568

ABSTRACT:
A method for fault tracing in automatically operating electronic measurement and test arrangements for a large number of electrochemical elements, wherein holders for the electrochemical elements are provided on the measurement and test arrangements and wherein cell simulators are provided with an external shape and size, including electrical connections, which approximately simulate one of the electrochemical elements to be tested, and contain test electronics, with a behaviour of the cell simulators with inverse polarity differing to a major extent from a behaviour with polarity based on the application, including the steps of inserting of the cell simulators into the holders, activating one of the cell simulators and applying a measurement current applied to it, measuring the voltage on the cell simulator and comparing the voltage with the nominal voltage predetermined for the cell simulator.

REFERENCES:
patent: 5460904 (1995-10-01), Gozdz et al.
patent: 5623196 (1997-04-01), Fernandez et al.
patent: 6693431 (2004-02-01), Leyde et al.
patent: 2003/0182793 (2003-10-01), Hald et al.
patent: 102 13 685.8 (2003-10-01), None
patent: 2 157 507 (1985-10-01), None

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