Semiconductor device manufacturing: process – Including control responsive to sensed condition
Reexamination Certificate
2005-10-11
2005-10-11
Chaudhuri, Olik (Department: 2823)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
C438S010000, C438S017000
Reexamination Certificate
active
06953696
ABSTRACT:
A method for fabricating a semiconductor integrated circuit device of the present invention forms an insulating film on a semiconductor wafer and forms a mask pattern containing a functional element or a wire on the formed insulating film. Dimensions of the mask pattern are changed in accordance with an amount of process variation occurring in the thickness or dielectric constant of the insulating film during the formation of the insulating film.
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Chaudhuri Olik
Malsawma Lex H.
McDermott Will & Emery LLP
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