Method for fabricating semiconductor devices having an HDP-CVD o

Semiconductor device manufacturing: process – Forming tapered edges on substrate or adjacent layers

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438666, 438667, 438668, 438672, 438673, H07L 2100

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060872780

ABSTRACT:
There is provided a method for fabricating a semiconductor device, by which passivation layers are formed with good step coverage to prevent crack or void from being occurred in high aspect ratio of metallization layers and the time for performing the processes can be decreased to enhance the productability and the yield of the device. The method is performed as follows. Over a substrate having completed metallization layers, an oxide layer is formed as a first passivation layer by high-density plasma chemical vapor deposition (HDP-CVD). On the HDP-CVD oxide layer, a nitride layer is formed as a second passivation layer by plasma enhanced chemical vapor deposition (PECVD) or HDP-CVD.

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Redeker Fred C et al., "Plasma Source For HDP-CVD Chamber", Patent Abstracts of Japan, Application No. 10028509, filed Feb. 10, 1998.

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