Method for fabricating semiconductor device

Semiconductor device manufacturing: process – Gettering of substrate – By implanting or irradiating

Reexamination Certificate

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Details

C438S663000, C438S664000, C438S680000, C438S682000, C257SE21165, C257SE21199, C257SE21438

Reexamination Certificate

active

07666762

ABSTRACT:
A method for fabricating a semiconductor device is provided. A nickel layer is deposited on a semiconductor substrate and plasma-processed. Rapid thermal processing is performed on the plasma-processed nickel layer to form a nickel silicide layer. The portion of the nickel layer that has not reacted with silicon is then removed.

REFERENCES:
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patent: 2004/0105934 (2004-06-01), Chang et al.
patent: 2005/0067661 (2005-03-01), Choi
patent: 2006/0281304 (2006-12-01), Tsuchiaki et al.
patent: 2007/0032057 (2007-02-01), Choon
patent: 2007/0141798 (2007-06-01), Bohr
patent: 2007/0298600 (2007-12-01), Suh et al.
patent: 2008/0137397 (2008-06-01), Furukawa et al.
patent: 2008/0146007 (2008-06-01), Balseanu et al.
patent: 2008/0242059 (2008-10-01), McSwiney et al.
patent: 10-2003-0101827 (2005-07-01), None

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