Method for fabricating isolation layer in semiconductor device

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

06949447

ABSTRACT:
A method for fabricating an isolation layer in a semiconductor device is disclosed. The disclosed method comprises steps of: forming a trench on a semiconductor substrate; forming a flowing insulating layer within the trench; making the insulating layer precise; and forming a precise insulating layer over an upper surface of the whole structure on which the flowing insulating layer is formed. According to the method of fabricating an isolation layer in a semiconductor device, occurrence of fine pores at adjacent active regions of sidewalls in a trench can be prevented.

REFERENCES:
patent: 4952524 (1990-08-01), Lee et al.
patent: 5866459 (1999-02-01), Naem et al.
patent: 5891809 (1999-04-01), Chau et al.
patent: 5956598 (1999-09-01), Huang et al.
patent: 6013559 (2000-01-01), Wu et al.
patent: 6150238 (2000-11-01), Wu et al.
patent: 6444541 (2002-09-01), Lai et al.
patent: 2003/0124465 (2003-07-01), Lee et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for fabricating isolation layer in semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for fabricating isolation layer in semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating isolation layer in semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3416332

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.