Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2005-07-12
2005-07-12
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S087000
Reexamination Certificate
active
06916680
ABSTRACT:
A method for fabricating an image sensor comprises forming an over coat layer on an upper face of a semiconductor substrate on which a color filter layer is formed, forming a microlens on the over coat layer; covering the microlens with a protection layer, back grinding a lower face of the semiconductor substrate, and removing the protection layer of the microlens. In this method, the protection layer is formed on the microlens of an image sensor and is subsequently removed after back grinding.
REFERENCES:
patent: 6001540 (1999-12-01), Huang et al.
patent: 6531266 (2003-03-01), Chang et al.
patent: 6643386 (2003-11-01), Foster
Kwon Dae Heok
Lee Jae Suk
DongbuAnam Semiconductor Inc.
Nhu David
Pillsbury Winthrop Shaw & Pittman LLP
LandOfFree
Method for fabricating image sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for fabricating image sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating image sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3389259