Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-04-04
2006-04-04
Nguyen, Ha Tran (Department: 2812)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S637000, C438S706000, C438S798000
Reexamination Certificate
active
07022619
ABSTRACT:
After a hole is formed in a low dielectric constant film on a substrate, a protective film is formed on the wall surface of the hole or an electron acceptor is caused to be adsorbed by or implanted in the low dielectric constant film exposed at the wall surface of the hole. Otherwise, resist residue is left on the wall surface of the hole. Then, a resist pattern having an opening corresponding to a wire formation region including a region formed with the hole is formed by using a chemically amplified resist.
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Kobori Etsuyoshi
Matsumoto Susumu
Satake Tetsuo
Yamanaka Michinari
Yamashita Takeshi
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
Nguyen Ha Tran
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