Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2007-11-13
2007-11-13
Geyer, Scott B. (Department: 2812)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C257SE31001
Reexamination Certificate
active
11320482
ABSTRACT:
In a method for fabricating a CMOS image sensor, microlenses are formed with a silicon nitride layer formed on a pad such that it is possible to decrease a height of microlens and to improve a refraction ratio. In addition to main lenses in shape of curved surface, inner lenses are formed in shape of a sidewall spacer by etching oxide and nitride layers at a high etching selection ratio.
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Donogbu Electronics Co., Ltd
Geyer Scott B.
McKenna Long & Aldridge LLP
Patel Reema
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