Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2005-06-21
2005-06-21
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C438S437000
Reexamination Certificate
active
06908831
ABSTRACT:
A method for encapsulating a filling in a trench of a semiconductor substrate includes providing a first barrier layer in a trench and a second barrier layer disposed above the first barrier layer. The trench is filled with a filling, which is subsequently etched back in an upper trench section, so that a hole is produced and a filling residue remains in a lower trench section. Subsequently, a non-conformal cover layer is provided in an upper trench section, so that the cover layer of a bottom region has a first thickness greater than a second thickness of a wall region of the cover layer. The cover layer and the second barrier layer are isotropically etched-back and removed from the upper trench section, and the first barrier layer remains. The bottom region remains covered resulting in the filling residue being encapsulated by the first barrier layer and the residual cover layer.
REFERENCES:
patent: 5229317 (1993-07-01), Nishio
patent: 6376893 (2002-04-01), Rha
patent: 6544861 (2003-04-01), Joo
patent: 6596607 (2003-07-01), Ahn
patent: 2002/0072198 (2002-06-01), Ahn
patent: 2003/0013271 (2003-01-01), Knorr et al.
patent: 2003/0013272 (2003-01-01), Hong et al.
patent: 2003/0022453 (2003-01-01), Park
patent: 101 57 785 (2003-06-01), None
O'Riain Lincoln
Radecker Jörg
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Stemer Werner H.
LandOfFree
Method for fabricating a semiconductor structure with an... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for fabricating a semiconductor structure with an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating a semiconductor structure with an... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3478819